Single Device Solution for High Speed Testing and Frequency Sweeping
Single Device Solution for High Speed Testing and Frequency Sweeping
Single Device for High Speed Testing and Frequency Sweeping
Measurement modes:LCR mode,Analyzer mode
(Sweeps with frequency and level),
Continuous measurement mode
Measurement parameters:Z,Y,θ,Rs(ESR),Rp,Rdc(DC resistance),
X, G, B, Cs, Cp, Ls, Lp,D (tanδ), Q
Measurement range:100mΩ to 100MΩ,12 ranges
Trigger function, Open/short compensation, Contact check
For more details refer datasheet.
Single Device for High Speed Testing and Frequency Sweeping
Measurement modes:LCR mode,Analyzer mode
(Sweeps with frequency and level),
Continuous measurement mode
Measurement parameters:Z,Y,θ,Rs(ESR),Rp,Rdc(DC resistance),
X, G, B, Cs, Cp, Ls, Lp,D (tanδ), Q
Measurement range:100mΩ to 100MΩ,12 ranges
Trigger function, Open/short compensation, Contact check
For more details refer datasheet.
The LCR200 is a passive component LCR meter. Discover the tremendous value with a range of features that help this meter provide the precise measurements you need. See simultaneous 20,000/2,000 count display of the primary parameter on the high contrast b
For R&D applications of Electrochemical Components and Materials, Batteries, and EDLCs
1MHz to 1.3GHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and 0.07% Variability
From R&D Applications to Windings, Coil and Transformer Manufacturing